Applied scanning probe methods: volumes i - xiii
Auteur :
Bhushan, Bharat
ISBN :
9783540888239
Date de publication :
27 févr. 2009
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Allemagne
Examining the physical and technical foundation for recent progress with this technique, this book offers a comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.