Novel algorithms for fast statistical analysis of scaled circuits
Auteur :
Singhee, Amith / Rutenbar, Rob A.
Éditeur :
Springer
ISBN :
9789048130993
Date de publication :
10 août 2009
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Nederlands
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits.