Infrared characterization for microelectronics

Auteur :
Lau, Wai Shing
Éditeur :
Lau, Wai Shing
ISBN :
9789810223526
Date de publication :
4 oct. 1999
Dimensions :
22,0 x 15,5 x 1,5 cm
Poids :
358 g
Langue :
Anglais
Pays d'origine :
Singapour
The focus of this text is on practical applications of infrared characterization useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement is discussed in detail.