Expert system for fatigue crack growth predictions based on fatigue crack closure
Auteur :
Song, Ji-Ho / Kim, Chung-Youb
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811680380
Date de publication :
6 mars 2023
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book demonstrates fatigue crack growth under random loading graphically. This system is unique as it is fundamentally different from previous systems as it focuses on fatigue crack growth predictions based on fatigue crack closure.