Microstructural characterisation techniques
Auteur :
Sastry, Gunturi Venkata Sitarama
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811935114
Date de publication :
17 sept. 2023
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy.