Reliability and radiation effects in compound semiconductors
Auteur :
Johnston, Allan H
Éditeur :
World Scientific Publishing Co Pte Ltd
ISBN :
9789814277105
Date de publication :
28 avr. 2010
Langue :
Anglais
Pays d'origine :
Singapour
Discusses reliability and radiation effects in compound semiconductors. This book features reliability mechanisms present in compound semiconductors that have produced a great deal of confusion.