X-ray scattering techniques for epitaxial oxide thin films
Éditeur :
Springer Nature Switzerland AG
ISBN :
9789819659449
Date de publication :
12 août 2025
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.