Erxin scales: child developmental scale of china
Auteur :
Jin, Chunhua / Gao, Zhenmin / Liu, Wenwen
Éditeur :
Springer Verlag, Singapore
ISBN :
9789819999965
Date de publication :
21 sept. 2024
Dimensions :
21,0 x 14,8 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book, drawing from internationally renowned scales like Bayley and Gesell, develops a child developmental assessment scale based on research data from Chinese children.