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Characteristics and control of low te...

Maurya, Rakesh Kumar

Springer International Publishing AG

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Characteristics and control of low te...

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Millimeter-wave low noise amplifiers

BoÅ¾aniÄ‡, Mladen / Sinha, Saurabh

Springer International Publishing AG

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Millimeter-wave low noise amplifiers

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Reactive extrusion: principles and ap...

Beyer, GÃ¼nter / Hopmann, Christian

Wiley-VCH Verlag GmbH

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Reactive extrusion: principles and ap...

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Mes compendium: perfect mes solutions...

Kletti, JÃ¼rgen / Deisenroth, Rainer

Springer Fachmedien Wiesbaden

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Mes compendium: perfect mes solutions...

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Formal methods for safety and security:

Springer Verlag, Singapore

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Formal methods for safety and security:

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Provisioning, recovery, and in-operat...

Velasco, Luis / Ruiz, Marc

John Wiley & Sons Inc

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Provisioning, recovery, and in-operat...

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Simulation of dynamic systems with ma...

Klee, Harold / Allen, Randal

Taylor & Francis Inc

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Simulation of dynamic systems with ma...

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Precision medicine, crispr, and genom...

Springer International Publishing AG

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Precision medicine, crispr, and genom...

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Patenting in biotechnology

Polyteknisk Boghandel og Forlag

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Patenting in biotechnology

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Asian and pacific coasts 2017 - proce...

World Scientific Publishing Co Pte Ltd

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Asian and pacific coasts 2017 - proce...

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Developments in maritime transportation

Taylor & Francis Inc

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Developments in maritime transportation

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Semiconductor x-ray detectors

Lowe, B. G. / Sareen, R. A.

Taylor & Francis Ltd

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Semiconductor x-ray detectors

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Characterisation of soft magnetic mat...

Zurek, Stanislaw

Taylor & Francis Ltd

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Characterisation of soft magnetic mat...

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Nanomaterials for supercapacitors

Taylor & Francis Inc

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Nanomaterials for supercapacitors

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Grid integration of solar photovoltai...

Jamil, Majid / Rizwan, M / Kothari, D P

Taylor & Francis Inc

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Grid integration of solar photovoltai...

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Nanostructured materials for type iii...

Royal Society of Chemistry

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Nanostructured materials for type iii...

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Hands-on experience with altera fpga ...

Parab, Jivan S. / Gad, Rajendra S. / Naik, G.M.

Springer, India, Private Ltd

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Hands-on experience with altera fpga ...

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Scanning electron microscopy and x-ra...

Goldstein, Joseph I. / Newbury, Dale E. / Michael, Joseph R. / Ritchie, Nicholas W.M. / Scott, John Henry J. / Joy, David C.

Springer-Verlag New York Inc.

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Scanning electron microscopy and x-ra...

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Introduction to process technology

Pearson Education (US)

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Introduction to process technology

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Analysis of cosmetic products

Elsevier Science & Technology

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Analysis of cosmetic products

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