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Laser safety

Henderson, Roy / Schulmeister, Karl

Taylor & Francis Ltd

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Laser safety

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High k gate dielectrics

Taylor & Francis Ltd

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High k gate dielectrics

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Civil engineering project management

Twort, Alan / Rees, Gordon

Taylor & Francis Ltd

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Civil engineering project management

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Information technology solutions for eh

Morahan, Thomas J.

Morahan, Thomas J.

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Information technology solutions for eh

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Technician's guide to fiber optics, 4e

Chartrand, LeoSterling, Donald J.,

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Technician's guide to fiber optics, 4e

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Fracture and fatigue emanating from s...

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Fracture and fatigue emanating from s...

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Ad hoc wireless networking

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Ad hoc wireless networking

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Interconnection noise in vlsi circuits

Moll, Francesc / Moll, FrancescRoca, Miquel,

Kluwer Academic Publishers

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Interconnection noise in vlsi circuits

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Ultrasonic destruction of surfactants...

Weavers, L. / Frim, J. / Rathman, J. / Pee, G.

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Ultrasonic destruction of surfactants...

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Navigating the tmdl process

Freedman, Paul L.

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Navigating the tmdl process

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Stormwater thermal enrichment in urba...

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Stormwater thermal enrichment in urba...

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Evaluation of microbial risk assessment

Soller, J. A. / Olivieri, A. W.

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Evaluation of microbial risk assessment

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Particles on surfaces: detection, adh...

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Particles on surfaces: detection, adh...

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Modern communications jamming princip...

Poisel, Richard A.

Poisel, Richard A.

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Modern communications jamming princip...

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Dietary fibre: bio-active carbohydrates

Wageningen Academic Publishers

Dietary fibre: bio-active carbohydrates

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Multiple user interfaces: cross-platf...

John Wiley & Sons Inc

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Multiple user interfaces: cross-platf...

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Appraisal, risk and uncertainty

Smith, Nigel J.

Emerald Publishing Limited

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Appraisal, risk and uncertainty

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Risk management and error reduction i...

Patankar, Manoj S. / Taylor, James C.

Taylor & Francis Ltd

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Risk management and error reduction i...

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Radiographic testing

American Society for Nondestructive Testing

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Radiographic testing

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Silicon microchannel heat sinks: theo...

Zhang, L.Goodson, Kenneth E.,Kenny, T.W.,

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Silicon microchannel heat sinks: theo...

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