Advanced chemistry of monolayers at interfaces: trends in methodology and technology: volume 14
Éditeur :
Elsevier Science Publishing Co Inc
ISBN :
9780123725707
Date de publication :
20 mars 2007
Poids :
830 g
Langue :
Anglais
Pays d'origine :
USA
Describes the advanced chemistry of monolayers at interfaces. Focusing on the trends of methodology and technology, this work introduces the methodologies of scanning probe microscopy, surface force instrumentation, surface spectroscopy, surface plasmon optics, reflectometry, and near-field scanning optical microscopy.