Defect and microstructure analysis by diffraction
Éditeur :
Oxford University Press
ISBN :
9780198501893
Date de publication :
6 janv. 2000
Dimensions :
24,1 x 16,2 x 4,8 cm
Poids :
1486 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.