Secrecy: the american experience
Auteur :
Moynihan, Daniel Patrick
Éditeur :
Yale University Press
ISBN :
9780300080797
Date de publication :
7 janv. 2000
Dimensions :
21,0 x 14,0 cm
Poids :
367 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
USA
An account of the development of secrecy as a mode of regulation in American governance since World War I - how it was born, how world events shaped it, how it has adversely affected momentous political decisions and events, and how it has eluded efforts to curtail or end it.