Scanning electron microscopy and x-ray microanalysis: third edition
Auteur :
Goldstein, Joseph / Newbury, Dale E. / Joy, David C. / Lyman, Charles E. / Echlin, Patrick / Lifshin, Eric / Sawyer, Linda / Michael, J.R.
Éditeur :
Springer Science+Business Media
ISBN :
9780306472923
Date de publication :
31 janv. 2003
Dimensions :
25,4 x 17,8 cm
Langue :
Anglais
Pays d'origine :
USA
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.