Influence of temperature on microelectronics and system reliability: a physics of failure approach
Auteur :
Lall, Pradeep / Pecht, Michael G. / Hakim, Edward B.
Éditeur :
Taylor & Francis Ltd
ISBN :
9780367400972
Date de publication :
19 juin 2019
Dimensions :
25,4 x 17,8 cm
Poids :
453 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.