Ion beam analysis: fundamentals and applications
Auteur :
Nastasi, Michael / Mayer, James W. / Wang, Yongqiang
Éditeur :
Taylor & Francis Ltd
ISBN :
9780367445843
Date de publication :
25 nov. 2019
Dimensions :
23,4 x 15,6 cm
Poids :
648 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, R