Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
Auteur :
Echlin, Patrick
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9780387857305
Date de publication :
19 mars 2009
Dimensions :
25,4 x 17,8 cm
Langue :
Anglais
Pays d'origine :
USA
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.