Introduction to the theory of point processes, an: volume i: elementary theory and methods
Auteur :
Daley, D.J. / Vere-Jones, D.
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9780387955414
Date de publication :
14 nov. 2002
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
Point processes and random measures find wide applicability in telecommunications, earthquakes, image analysis, spatial point patterns, and stereology, to name but a few areas.