Analysis of residual stress by diffraction using neutron and synchrotron radiation
Éditeur :
Taylor & Francis Ltd
ISBN :
9780415303972
Date de publication :
6 févr. 2003
Dimensions :
22,9 x 15,2 cm
Poids :
875 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the