Esd testing: from components to systems
Auteur :
Voldman, Steven H.
Éditeur :
John Wiley & Sons Inc
ISBN :
9780470511916
Date de publication :
2 déc. 2016
Dimensions :
24,6 x 17,5 x 2,0 cm
Poids :
635 g
Langue :
Anglais
Pays d'origine :
USA
Presenting information on electrostatic discharge (ESD) and the characterization of semiconductor devices, this book examines ESD physical models and discusses the test systems and testing and specifications of each model, including the RF ESD test systems and magnetic recording (MR) systems and latchup.