Cluster secondary ion mass spectrometry: principles and applications
Auteur :
Mahoney, Christine M.
Éditeur :
John Wiley & Sons Inc
ISBN :
9780470886052
Date de publication :
15 juil. 2013
Dimensions :
23,9 x 16,0 x 2,5 cm
Poids :
748 g
Langue :
Anglais
Pays d'origine :
USA
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.