Scanning probe microscopy and spectroscopy: theory, techniques, and applications
Éditeur :
John Wiley & Sons Inc
ISBN :
9780471248248
Date de publication :
3 janv. 2001
Dimensions :
23,8 x 16,4 x 3,2 cm
Poids :
830 g
Langue :
Anglais
Pays d'origine :
USA
Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science.