X-ray spectrometry: recent technological advances
Éditeur :
John Wiley & Sons Inc
ISBN :
9780471486404
Date de publication :
12 mars 2004
Dimensions :
22,9 x 15,2 x 3,9 cm
Poids :
1474 g
Langue :
Anglais
Pays d'origine :
USA
Covers the developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. This title includes the advanced and high-tech aspects of the chemical analysis techniques based on x-rays. It introduces various types of X-ray optics and X-ray detectors, covering history, principles, characteristics and trends.