Reliability wearout mechanisms in advanced cmos technologies
Auteur :
Strong, Alvin W. / Wu, Ernest Y. / Vollertsen, Rolf-Peter / Sune, Jordi / La Rosa, Giuseppe / Sullivan, Timothy D. / Rauch, Stewart E., III
Éditeur :
John Wiley & Sons Inc
ISBN :
9780471731726
Date de publication :
4 sept. 2009
Dimensions :
24,3 x 16,4 x 3,4 cm
Poids :
993 g
Langue :
Anglais
Pays d'origine :
USA
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.