Semiconductor material and device characterization
Auteur :
Schroder, Dieter K.
Éditeur :
John Wiley & Sons Inc
ISBN :
9780471739067
Date de publication :
17 févr. 2006
Dimensions :
21,0 x 15,0 x 2,5 cm
Poids :
1199 g
Format :
book
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.