Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks
Auteur :
Krinsley, David H. / Pye, Kenneth / Boggs, Jr, Sam / Tovey, N. Keith
Éditeur :
Cambridge University Press
ISBN :
9780521019743
Date de publication :
15 sept. 2005
Dimensions :
26,1 x 20,7 x 1,9 cm
Poids :
763 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This concise summary uses abundant images to illustrate the type of information backscattered scanning electron microscopy (BSE) yields and the application of the technique to the study of sediments and sedimentary rocks. Heavily illustrated.