Atom-probe field ion microscopy: field ion emission, and surfaces and interfaces at atomic resolution
Auteur :
Tsong, Tien T.
Éditeur :
Cambridge University Press
ISBN :
9780521019934
Date de publication :
15 sept. 2005
Dimensions :
23,4 x 15,5 x 2,0 cm
Poids :
558 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.