Characterization of high tc materials and devices by electron microscopy
Éditeur :
Cambridge University Press
ISBN :
9780521031707
Date de publication :
23 nov. 2006
Dimensions :
24,3 x 16,8 x 2,1 cm
Poids :
669 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.