Modeling and characterization of rf and microwave power fets
Auteur :
Aaen, Peter / Plá, Jaime A. / Wood, John
Éditeur :
Cambridge University Press
ISBN :
9780521336178
Date de publication :
30 juin 2011
Dimensions :
24,4 x 17,0 x 2,0 cm
Poids :
610 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.