Electronic thin-film reliability
Auteur :
Tu, King-Ning
Éditeur :
Cambridge University Press
ISBN :
9780521516136
Date de publication :
25 nov. 2010
Dimensions :
25,4 x 18,0 x 2,3 cm
Poids :
970 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Based on a graduate course at UCLA, this book describes reliability and failure of thin films. Beginning with core topics such as deposition and diffusion, the book fully explains irreversible processes with practical examples. Closing with failure analysis, this book is ideal for graduate students, researchers and practitioners.