Introduction to conventional transmission electron microscopy
Auteur :
De Graef, Marc
Éditeur :
Cambridge University Press
ISBN :
9780521629959
Date de publication :
27 mars 2003
Dimensions :
24,4 x 17,0 x 3,8 cm
Poids :
1160 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This graduate level 2003 textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text.