Thin film materials: stress, defect formation and surface evolution
Auteur :
Freund, L. B. / Suresh, S.
Éditeur :
Cambridge University Press
ISBN :
9780521822817
Date de publication :
8 janv. 2004
Dimensions :
25,5 x 18,0 x 4,3 cm
Poids :
1650 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. Describing fundamental concepts with practical case studies, highly illustrated, thorough referencing and containing numerous homework problems, this book will be essential for graduate courses on thin films and the classic reference for researchers.