Focused ion beam systems: basics and applications
Éditeur :
Cambridge University Press
ISBN :
9780521831994
Date de publication :
13 sept. 2007
Dimensions :
24,4 x 17,0 x 2,4 cm
Poids :
850 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.