Electron microscopy and analysis
Auteur :
Goodhew, Peter J.
Éditeur :
Taylor & Francis Ltd
ISBN :
9780748409686
Date de publication :
30 nov. 2000
Dimensions :
23,4 x 15,6 cm
Poids :
380 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.