Microscopy of semiconducting materials: 1999 proceedings of the institute of physics conference held 22-25 march 1999, university of oxford, uk
Éditeur :
Taylor & Francis Ltd
ISBN :
9780750306508
Date de publication :
1 janv. 2000
Dimensions :
23,4 x 15,6 cm
Poids :
1428 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.