Iddq testing of vlsi circuits
Auteur :
Gulati, Ravi K.
ISBN :
9780792393153
Date de publication :
1 déc. 1992
Dimensions :
25,4 x 17,8 x 0,9 cm
Poids :
452 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health.