Thermal-aware testing of digital vlsi circuits and systems
Auteur :
Chattopadhyay, Santanu
Éditeur :
Taylor & Francis Inc
ISBN :
9780815378822
Date de publication :
25 avr. 2018
Dimensions :
21,6 x 13,8 cm
Poids :
300 g
Langue :
Anglais
Pays d'origine :
USA
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.