Memory, microprocessor, and asic
Éditeur :
Taylor & Francis Inc
ISBN :
9780849317378
Date de publication :
26 mars 2003
Dimensions :
25,4 x 17,8 cm
Poids :
864 g
Langue :
Anglais
Pays d'origine :
USA
Timing, memory, power dissipation, testing, and testability are crucial elements of VLSI circuit design. This title treats stacked gate, embedded, and flash memory, including their power consumption and developments in low-power memories. It provides a chapter to deal with the topic of application-specific integrated circuits (ASICs).