Microelectronic reliability: v. 1: reliability, test and diagnostics
Auteur :
Hakim, Edward B.
ISBN :
9780890062845
Date de publication :
1 févr. 1989
Dimensions :
22,9 x 15,2 x 2,5 cm
Poids :
750 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought