Vlsi fault modeling and testing techniques
Éditeur :
Bloomsbury Publishing Plc
ISBN :
9780893917814
Date de publication :
1 mai 1993
Langue :
Anglais
Pays d'origine :
USA
This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis models.