Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists
Auteur :
ZhiLi, Dong
Éditeur :
Taylor & Francis Ltd
ISBN :
9781032246802
Date de publication :
27 nov. 2025
Dimensions :
23,4 x 15,6 cm
Poids :
500 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.