Advanced materials characterization: basic principles, novel applications, and future directions
Auteur :
Kumar, Ch Sateesh / Singh, M. Muralidhar / Krishna, Ram
Éditeur :
Taylor & Francis Ltd
ISBN :
9781032375113
Date de publication :
29 nov. 2024
Dimensions :
23,4 x 15,6 cm
Poids :
270 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.