Statistical methods for qtl mapping
Auteur :
Chen, Zehua
Éditeur :
Taylor & Francis Ltd
ISBN :
9781032922683
Date de publication :
14 oct. 2024
Dimensions :
23,4 x 15,6 cm
Poids :
453 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
While numerous advanced statistical approaches have recently been developed for quantitative trait loci (QTL) mapping, the methods are scattered throughout the literature. This book brings together many recent statistical techniques that address the data complexity of QTL mapping. It emphasizes the modern statistical methodology for QTL mapping