Machine learning for high-risk applications: approaches to responsible ai
Auteur :
Hall, Patrick / Curtis, James / Pandey, Parul
Éditeur :
O'Reilly Media
ISBN :
9781098102432
Date de publication :
2 mai 2023
Dimensions :
23,2 x 17,8 cm
Langue :
Anglais
Pays d'origine :
USA
This book describes responsible AI, a holistic approach for improving AI/ML technology, business processes, and cultural competencies that builds on best practices in risk management, cybersecurity, data privacy, and applied social science.