Measurement techniques for radio frequency nanoelectronics
Auteur :
Wallis, T. Mitch / Kabos, Pavel
Éditeur :
Cambridge University Press
ISBN :
9781107120686
Date de publication :
14 sept. 2017
Dimensions :
25,3 x 17,8 x 1,8 cm
Poids :
790 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.