Wavelet analysis and multiresolution methods
Auteur :
He, Tian-Xiao
Éditeur :
Taylor & Francis Ltd
ISBN :
9781138442665
Date de publication :
21 août 2017
Dimensions :
25,4 x 17,8 cm
Poids :
453 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Contains papers selected from the Wavelet Analysis and Multiresolution Methods Session of the AMS meeting held at the University of Illinois at Urbana-Champaign. This volume includes contributions which cover: construction, analysis, computation and application of multiwavelets; scaling vectors; nonhomogenous refinement; and other related topics.