High performance memory testing: design principles, fault modeling and self-test
Auteur :
Adams, R. Dean
Éditeur :
Adams, R. Dean
ISBN :
9781402072550
Date de publication :
1 sept. 2002
Dimensions :
23,4 x 15,6 x 1,5 cm
Poids :
553 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
Memory applications and the number of designs and the sheer number of bits on each design are critical. Based on the author's experience in memory design, memory reliability development and memory self test, this book is written for professionals and researchers, helping them understand the memories that are tested.