Microwave tomography: global optimization, parallelization and performance evaluation
Auteur :
Noghanian, Sima / Sabouni, Abas / Desell, Travis / Ashtari, Ali
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781493907519
Date de publication :
21 juil. 2014
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
This book provides a detailed overview on the use of global optimization and parallel computing in microwave tomography techniques. The authors provide parallelization techniques on homogeneous and heterogeneous computing architectures on high performance and general purpose futuristic computers.