Pattern recognition and machine learning
Auteur :
Bishop, Christopher M.
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781493938438
Date de publication :
23 août 2016
Dimensions :
25,4 x 17,8 cm
Langue :
Anglais
Pays d'origine :
USA
Pattern recognition has its origins in engineering, whereas machine learning grew out of computer science. In particular, Bayesian methods have grown from a specialist niche to become mainstream, while graphical models have emerged as a general framework for describing and applying probabilistic models.