Scanning probe microscopy of functional materials: nanoscale imaging and spectroscopy
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781493939473
Date de publication :
23 août 2016
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.